Simultaneous Nanoscale Imaging of Surface and Bulk Atoms

UPTON, NY — Scientists at the U.S. Department of Energy’s (DOE) Brookhaven National Laboratory, in collaboration with researchers from Hitachi High Technologies Corp., have demonstrated a new scanning electron microscope capable of selectively imaging single atoms on the top surface of a specimen while a second, simultaneous imaging signal shows atoms throughout the sample’s depth. This new tool, located at Brookhaven Lab’s Center for Functional Nanomaterials (CFN), will greatly expand scientists’ ability to understand and ultimately control chemical reactions, such as those of catalysts in energy-conversion devices...


http://www.bnl.gov/cfn/news/PRdisplay.asp?prID=1008