Thursday, December 1, 2005

2005

1 J. Bai, X. Huang, M. Dudley et al., "Intersecting basal plane and prismatic stacking fault structures and their formation mechanisms in GaN," J. Appl. Phys. 98 (6), 9 (2005).

2 M. Beleggia and M. De Graef, "General magnetostatic shape-shape interactions," J. Magn. Magn. Mater. 285 (1-2), L1-L10 (2005).

3 M. Beleggia, M. De Graef, Y. Millev et al., "Demagnetization factors for elliptic cylinders," J. Phys. D: Appl. Phys 38, 3333-3342 (2005).

4 M. Beleggia, J. Lau, M. A. Schofield et al., "Phase diagram for magnetic nano-rings," J. Mag. Mag. Mater. 301, 131-146 (2005).

5 M. Beleggia and Y Zhu, in Modern techniques for characterizing magnetic materials, edited by Y Zhu (Kluwer Academics, 2005).

6 M. Beleggia, Y. Zhu, S. Tandon et al., "Shape-induced ferromagnetic ordering in a triangular array of magnetized disks," Appl. Phys. Lett. 87 (20), 3 (2005).

7 L. D. Cooley, A. J. Zambano, A. R. Moodenbaugh et al., "Inversion of two-band superconductivity at the critical electron doping of (Mg,Al)B-2," Phys. Rev. Lett. 95 (26), 4 (2005).

8 R. Fazzini, G. Pozzi, and M. Beleggia, "Electron optical phase-shifts by Fourier methods: Analytical versus numerical calculations," Ultramicroscopy 104 (3-4), 193-205 (2005).

9 W. Gao, R. Klie, and E. I. Altman, "Growth of anatase films on vicinal and flat LaAlO3 (110) substrates by oxygen plasma assisted molecular beam epitaxy," Thin Solid Films 485 (1-2), 115-125 (2005).

10 W. Q. Han, L. J. Wu, and Y. M. Zhu, "Formation and oxidation state of CeO2-x nanotubes," J. Am. Chem. Soc. 127 (37), 12814-12815 (2005).

11 W. Q. Han, L. J. Wu, Y. M. Zhu et al., "In-situ formation of ultrathin Ge nanobelts bonded with nanotubes," Nano Lett. 5 (7), 1419-1422 (2005).

12 B. H. Hong, J. Y. Lee, T. Beetz et al., "Quasi-continuous growth of ultralong carbon nanotube arrays," J. Am. Chem. Soc. 127 (44), 15336-15337 (2005).

13 X. R. Huang, J. Bai, M. Dudley et al., "Step-controlled strain relaxation in the vicinal surface epitaxy of nitrides," Phys. Rev. Lett. 95 (8), 4 (2005).

14 R. Klie, I. Arslan, and N. D. Browning, "Atomic Resolution Electron Energy-Loss Spectroscopy," J. Electron Spectrosc. Relat. Phenom. 143 (2-3), 107-117 (2005).

15 R. F. Klie, J. P. Buban, M. Varela et al., "Enhanced current transport at grain boundaries in high-T-c superconductors," Nature 435 (7041), 475-478 (2005).

16 R. F. Klie and Y. Zhu, "Atomic resolution STEM analysis of defects and interfaces in ceramic materials," Micron 36 (3), 219-231 (2005).

17 R. F. Klie, Y. Zhu, E. I. Altman et al., "Atomic structure of epitaxial SrTiO3-GaAs(001) heterojunctions," Appl. Phys. Lett. 87 (14), 3 (2005).

18 J. W. Lau, M. Beleggia, M. A. Schofield et al., "Direct correlation of reversal rate dynamics to domain configurations in micron-sized permalloy elements," J. Appl. Phys. 97 (10), 3 (2005).

19 M. Malac, R. Egerton, M. Freeman et al., "Electron-beam patterning with sub-2 nm line edge roughness," J. Vac. Sci. Technol. B 23 (1), 271-273 (2005).

20 E. Stern, G. Cheng, E. Cimpoiasu et al., "Electrical characterization of single GaN nanowires," Nanotechnology 16 (12), 2941-2953 (2005).

21 M. Suenaga, V.F. Solovyov, L. Wu et al., in Second-generation HTS conductors (Kluwer Academic, 2005), pp. 135-148.

22 E. Sutter, P. Sutter, and Y. M. Zhu, "Assembly and interaction of Au/C core-shell nanostructures: In situ observation in the transmission electron microscope," Nano Lett. 5 (10), 2092-2096 (2005).

23 J. Tang, T. Zhang, P. Zoogman et al., "Martensitic phase transformation of isolated HfO2, ZrO2, and HfxZr1-xO2 (0 < x < 1) nanocrystals," Adv. Funct. Mater. 15 (10), 1595-1602 (2005).

24 L. Wu, Y. Zhu, S. Park et al., "Defect structure of the high-dielectric-constant perovskite CaCu3Ti4O12," Phys. Rev. B 71 (1), 7 (2005).

25 Z. X. Ye, Q. Li, Y. Hu et al., "Enhanced flux pinning in YBa2Cu3O7-delta films by nanoscaled substrate surface roughness," Appl. Phys. Lett. 87 (12), 3 (2005).

26 J. C. Zheng, Y. M. Zhu, L. J. Wu et al., "On the sensitivity of electron and X-ray scattering factors to valence charge distributions," J. Appl. Crystallogr. 38, 648-656 (2005).